1. Advanced calculations for defects in materials
Author: / edited by Audrius Alkauskas ...[et al].
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Materials--Testing--Mathematical models.,Semiconductors--Materials--Testing.
Classification :
TA
410
.
A379
2011
2. Advanced calculations for defects in materials
Author: / edited by Audrius Alkauskas ...[et al]
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Materials, Testing, Mathematical models,Semiconductors, Materials, Testing
Classification :
TA410
.
A379
2011
3. Advanced calculations for defects in materials : electronic structure methods
Author: edited by Audrius Alkauskas ...]et al[
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: Testing Mathematical models ، Materials,Materials Testing ، Semiconductors
Classification :
TA
410
.
A379
2011
4. Beam injection assessment of defects in semiconductors
Author: / edited by M. Kittler...(et al)
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors- Defects- Congresses,Semiconductors- Defects- Testing
Classification :
QC10
.
J1I421
1998
5. Debye Screening Length.
Author: \ Kamakhya Prasad Ghatak, Sitangshu Bhattacharya
Library: Library of Foreign Languages and Islamic Sources (Qom)
Subject: Nanostructured materials,موادنانوساختار,a01,a01,Semiconductors -- Testing -- Optical methods.,Thomas-Fermi theory,نیمههادیها -- آزمایش -- روش های نوری
Classification :
TA
418
.
9
.
G46D4
2014
E-Book
,
6. Defect oriented testing for nano metric CMOS vlsi circuits
Author: Sachdev, Manoj.
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: ، Metal oxide semiconductors, Complementary- Testing,، Metal oxide semiconductors, Complementary- Defects
Classification :
TK
7871
.
99
.
M44
S23
2007
7. Electrical characterization of GaAs materials and devices
Author: / David C. Look,Look
Library: Central Library and Documents Center of Tehran University (Tehran)
Subject: Gallium arsenide semiconductors -- Testing,Magnetoresistance
Classification :
TK
7871
.
15
.
G3L66
1989
8. Electrical characterization of GaAs materials and devices
Author: / David C. Look
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Gallium arsenide semiconductors - Testing,Magnetoresistance
Classification :
TK
7871
.
15
.
L6
1989
9. Electrical characterization of GaAs materials and devices
Author: Look, D. C. )David C.(, 8391-
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Gallium arsenide semiconductors- Testing,، Magnetoresistance
Classification :
TK
7871
.
15
.
G3L66
1989
10. Electrical characterization of GaAs materials and devices
Author: Look, David C.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing ، Gallium arsenide semiconductors,Magnetoresistance
Classification :
TK
7871
.
15
.
G3
L66
1989
11. Failure analysis of integrated circuits :tools and techniques
Author: edited by Lawrence C. Wagner
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: Failures ، Semiconductors,Testing ، Integrated circuits,Reliability ، Integrated circuits
Classification :
TK
7871
.
852
.
F35
1999
12. Failure analysis of integrated circuits : tools and techniques
Author: edited by Lawrence C. Wagner
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Semiconductors - Failures , Integrated circuits - Testing , Integrated circuits - Reliability
Classification :
TK
7871
.
852
.
F35
1999
13. Handbook of solid-state troubleshooting
Author: Herrick, Clyde N.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Semiconductors-- Testing,، Electronic apparatus and appliances-- Maintenance and repair
Classification :
TK
7871
.
85
.
H47
14. Handbook of solid-state troubleshooting
Author: Herrick, Clyde N.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing ، Semiconductors,Maintenance and reprint ، Electronic apparatus and appliances
Classification :
TK
7871
.
85
.
H47
15. ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures: March 22-25, 1993, Sitges, Barcelona, Spain
Author: sponsored by the IEEE Electron Devices Society
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Testing - Congresses , Semiconductors - Testing - Congresses , Transistors - Testing - Congresses
Classification :
TK
7874
.
I3233
1993
16. IDDQ testing of VLSI circuits
Author: / edited by Ravi K. Gulati and Charles F. Hawkins
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing,Metal oxide semiconductors, Complementary - Testing,Iddq testing
Classification :
TK
7874
.
I3223
1993
17. 2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada
Author: sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing -- Congresses ، Metal oxide semiconductors, Complementary,Congresses ، Iddq testing,Defects -- Congresses ، Integrated circuits
Classification :
TK
7871
.
99
.
M44
2000
18. Integrated circuit failure analysis: a guide to preparation techniques
Author: Beck, Friedrich
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Semiconductors- Failures,، Semiconductors_ Testing
Classification :
TK
7871
.
852
.
B43
19. Integrated circuit manufacturability
Author: edited by Josae Pineda de Gyvez, Dhiraj Pradhan
Library: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
Subject: Integrated circuits, Computer-aided design,Metal oxide semiconductors, Complementary, Computer-aided design,Integrated circuits, Testing
Classification :
TK
,
7874
,.
I4713
20. Lock-in thermograph
Author: / O. Breitenstein, W. Warta, M. Langenkamp
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography,Electronic books
Classification :
TK7870
.
25
.
B74
2010
